22 Feb 2024 Short-wavelength infrared (SWIR) imaging stands out as an optimal solution for non-destructive inspection, as it allows you to see beneath surfaces, identify materials based on their SWIR spectral signatures, and ensure product quality safely and conveniently.
The C15333-10E04 InGaAs camera has SWIR sensitivity ranging from 950 nm to 1700 nm and features a 1024-pixel linear array and a maximum line rate of 40 kHz. Its integration with Gigabit Ethernet interfaces and support for GigE Vision enhances its connectivity and usability.
In comparison to its predecessor, the C15333-10E04 boasts a novel edge trigger function capable of capturing images with a specified exposure time, accommodating changes in conveyor belt speed during the process. In addition, the trigger enable function selectively captures images only when an object is present in front of the camera.
The features of the C15333-10E04, together with background subtraction and real-time shading correction, make it an ideal solution for production lines in the food and semiconductor industry. Applications include checking liquid volumes in packages, contaminant detection, silicon wafer pattern inspection, and identifying defects in solar cells.
Learn more | 
